EMFIBSEMFIG 4: FEI Helios Nanolab 650.

A. FEI Helios Nanolab 650 focused ion beam milling SEM used for acquiring FIB/SEM data.
B. Closeup of the specimen cryo-transfer station for the Helios 650 FIB/SEM, which permits frozen samples to be transferred into the chamber for focused ion beam milling.

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